Key Applications

  • Scanning Electron Microscopy (SEM & FIB)
  • Transmission Electron Microscopy (TEM)
  • Scanning Tunnel Microscopy (STM)
  • Interferometry & Wafer Inspection Systems
  • Stationary Roughness Measuring Systems
  • Nanoengineering & Nanolithography


AVI400S/4/LP

AVI400-S/4/LP

AVI400-S/4/LP with LFS-3 sensor supporting a ThermoFisher Talos TEM

AVI400EM/2/LP

AVI400-EM/2/LP

AVI400EM/2/LP supporting a Zeiss Sigma 300 VP