Key Applications Scanning Electron Microscopy (SEM & FIB) Transmission Electron Microscopy (TEM) Scanning Tunnel Microscopy (STM) Interferometry & Wafer Inspection Systems Stationary Roughness Measuring Systems Nanoengineering & Nanolithography AVI400-S/4/LP AVI400-S/4/LP with LFS-3 sensor supporting a ThermoFisher Talos TEM AVI400-EM/2/LP AVI400EM/2/LP supporting a Zeiss Sigma 300 VP