Key Applications
- Laser Scanning Microscopy
- Scanning Probe Microscopy (AFM,STM)
- Scanning Near-Field Optical Microscopy (SNOM)
- Interferometry & Profilometry
- Micro & Nano Hardness Tester
- Nano Indentation & Nano Lithography
![TS-150/LP](/images/products/ts150/alpha300RA_AFM_Mode_small.jpg)
TS-150/LP
TS-150/LP supporting a WITec alpha300RA AFM (image © WITec)
![TS-150/LP](/images/products/ts150/WTC_LabImage_cropped.png)
TS-150/LP
© WITec
![TS-150/LP](/images/products/ts150/Trioptics_muPhaseST_wB.png)
TS-150/LP
TS-150/LP supporting a Trioptics µPhase ST Interferometer
![TS-140/LP](/images/products/ts140/Promicron2_cut_wBG.png)
TS-140/LP
TS-140/LP supporting a Promicron Workstation for Metrology and Inspection