Key Applications

  • Laser Scanning Microscopy
  • Scanning Probe Microscopy (AFM,STM)
  • Scanning Near-Field Optical Microscopy (SNOM)
  • Interferometry & Profilometry
  • Micro & Nano Hardness Tester
  • Nano Indentation & Nano Lithography
TS-150/LP

TS-150/LP

TS-150/LP supporting a WITec alpha300RA AFM (image © WITec)

TS-150/LP

TS-150/LP

© WITec

TS-150/LP

TS-150/LP

TS-150/LP supporting a Trioptics µPhase ST Interferometer

TS-140/LP

TS-140/LP

TS-140/LP supporting a Promicron Workstation for Metrology and Inspection